Robust staffline thickness and distance estimation in binary and gray-level music scores

dc.contributor.authorCardoso, Jaime S.
dc.contributor.authorRebelo, Ana
dc.date.accessioned2018-12-18T17:10:58Z
dc.date.available2018-12-18T17:10:58Z
dc.date.issued2010
dc.description.abstractThe optical recognition of handwritten musical scores by computers remains far from ideal. Most OMR algorithms rely on an estimation of the staffline thickness and the vertical line distance within the same staff. Subsequent operation can use these values as references, dismissing the need for some predetermined threshold values. In this work we improve on previous conventional estimates for these two reference lengths. We start by proposing a new method for binarized music scores and then extend the approach for graylevel music scores. An experimental study with 50 images is used to assess the interest of the novel method.pt_PT
dc.description.sponsorshipThis work was partially funded by Fundação para a Ciência e a Tecnologia (FCT) - Portugal through project PTDC/EIA/71225/2006.pt_PT
dc.identifier.citationCardoso, J. S., & Rebelo, A. (2010). Robust staffline thickness and distance estimation in binary and gray-level music scores. In 20th International Conference on Pattern Recognition (ICPR 2010), Istanbul, Turkey, 23-26 August 2010 (pp. 1-4). Disponível no Repositório UPT, http://hdl.handle.net/11328/2485pt_PT
dc.identifier.doi10.1109/ICPR.2010.458pt_PT
dc.identifier.urihttp://hdl.handle.net/11328/2485
dc.language.isoengpt_PT
dc.peerreviewedyespt_PT
dc.publisherIEEEpt_PT
dc.rightsopen accesspt_PT
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/pt_PT
dc.subjectOptical Music Recognition (OMR)pt_PT
dc.subjectDocument image processingpt_PT
dc.subjectImage analysispt_PT
dc.titleRobust staffline thickness and distance estimation in binary and gray-level music scorespt_PT
dc.typeconferenceObjectpt_PT
degois.publication.firstPage1pt_PT
degois.publication.lastPage4pt_PT
degois.publication.locationIstanbul, Turkeypt_PT
degois.publication.title20th International Conference on Pattern Recognition (ICPR 2010)pt_PT
dspace.entity.typePublicationen

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